柯毅成
Yicheng Ke portrait

柯毅成

微电子科学与技术 · 中山大学

我是一名微电子科学与技术本科生，关注 3D NAND 与 FeFET 器件在极端温度、统计变异和阵列级应用中的可靠性。

如果你想交流，欢迎给我发邮件： keych@mail2.sysu.edu.cn。

目前，我主要关注这些问题：

    Selected Projects

    edl.ieee.org / featured-paper EDL · 2026

    IEEE ELECTRON DEVICE LETTERS · FEATURED PAPER

    Predicting 3D NAND Reliability Across Extreme Temperatures

    A mechanism-informed model for threshold-voltage mean and sigma from −55°C to 125°C.

    Read the paper HPLR · LPHR · P1–P7
    FIRST PAGE / EDL 2026232-LAYER TLC NAND
    Title and abstract preview from the first page of the EDL paper

    Featured paper · IEEE Electron Device Letters · 2026

    Predicting 3D NAND Reliability Across Extreme Temperatures

    A mechanism-informed model connects trap, barrier, and mobility physics to threshold-voltage mean and sigma from −55°C to 125°C.

      Recent Publications

      Experience